An Equivalent-Effect Phenomenon in Eddy Current Non-Destructive Testing of Thin Structures
Yin, Wuliang; Tang, Jiawei; Lu, Mingyang; Xu, Hanyang; Huang, Ruochen; Zhao, Qian; Zhang, Zhijie; Peyton, Anthony
- 期刊名称IEEE Access
- 作者Yin, Wuliang; Tang, Jiawei; Lu, Mingyang; Xu, Hanyang; Huang, Ruochen; Zhao, Qian; Zhang, Zhijie; Peyton, Anthony
- 卷第7卷
- 电子ISSN2169-3536
- 文件大小48.04KB
- 发表时间2019
- DOI10.1109/ACCESS.2019.2916980
- 页码70296-70307