[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Effects of Annealing Temperature on the Properties of ZnO Thin Films and Ultraviolet Photodetectors
Wang, Wenxia; Liu, Yantao; Ma, Jianping; Wang, Ying; Peng, Xin; He, Jiqiang
- 作者Wang, Wenxia; Liu, Yantao; Ma, Jianping; Wang, Ying; Peng, Xin; He, Jiqiang
- 文件大小330.27KB
- 发表时间2019
- DOI10.1109/EDSSC.2019.8754062
- 页码1-3