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[IEEE 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - Detroit, MI, USA (2019.6.19-2019.6.21)] 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - On-Board SiC MOSFET Degradation Monitoring Through Readily Available Inverter Current/Voltage Sensors

[IEEE 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - Detroit, MI, USA (2019.6.19-2019.6.21)] 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - On-Board SiC MOSFET Degradation Monitoring Through Readily Available Inverter Current/Voltage Sensors

Pu, Shi; Yang, Fei; Ugur, Enes; Vankayalapati, Bhanu Teja; Xu, Chi; Akin, Bilal
  • 作者Pu, Shi; Yang, Fei; Ugur, Enes; Vankayalapati, Bhanu Teja; Xu, Chi; Akin, Bilal
  • 文件大小1132.33KB
  • 发表时间2019
  • DOI10.1109/itec.2019.8790611
  • 页码1-5
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