[IEEE 2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" - Rzeszów, Poland (2019.6.27-2019.6.29)] 2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems" - Yield and Reliability Challenges at 7nm and Below

• 作者Strojwas, Andrzej J.; Doong, Kelvin; Ciplickas, Dennis
• 文件大小1390.81KB
• 发表时间2019
• DOI10.23919/MIXDES.2019.8787167
• 页码52-55