[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior
Karmel Kranthi, Nagothu; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank
- 作者Karmel Kranthi, Nagothu; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank
- 文件大小847.31KB
- 发表时间2019
- DOI10.1109/irps.2019.8720484
- 页码1-5