[IEEE 2019 18th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 18th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Effect of Prolonged Storage Up to 1-Year on Anand Parameters for SAC105 Leadfree Alloys
Lall, Pradeep; Yadav, Vikas; Suhling, Jeff; Locker, David
- 作者Lall, Pradeep; Yadav, Vikas; Suhling, Jeff; Locker, David
- 文件大小1514.34KB
- 发表时间2019
- DOI10.1109/ITHERM.2019.8757441
- 页码303-318