Validation of Thermal Resistance Extracted From Measurements on Stripe Geometry SiGe HBTs

• 期刊名称IEEE Transactions on Electron Devices
• 作者Balanethiram, Suresh; D'Esposito, Rosario; Fregonese, Sebastien; Chakravorty, Anjan; Zimmer, Thomas
• 印刷ISSN0018-9383
• 电子ISSN1557-9646
• 文件大小876.86KB
• 发表时间2019
• DOI10.1109/TED.2019.2935012
• 页码1-5