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Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry

Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry

Singh, Richa; Tripathi, Shweta

期刊名称Optical and Quantum Electronics
作者Singh, Richa; Tripathi, Shweta
卷第51卷
期第10期
印刷ISSN0306-8919
电子ISSN1572-817X
文件大小4907.70KB
发表时间2019-10
DOI10.1007/s11082-019-2041-3

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