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Robustness and reliability review of Si and SiC FET devices for more-electric-aircraft applications

Robustness and reliability review of Si and SiC FET devices for more-electric-aircraft applications

Ortiz Gonzalez, J.; Wu, R.; Agbo, S.N.; Alatise, O.

期刊名称Microelectronics Reliability
作者Ortiz Gonzalez, J.; Wu, R.; Agbo, S.N.; Alatise, O.
印刷ISSN0026-2714
文件大小1647.89KB
发表时间2019-9
DOI10.1016/j.microrel.2019.06.016

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