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Structural, Morphological, and Optical Characterization of GaN/p-Si Thin Films for Various Argon Flow Rates

Structural, Morphological, and Optical Characterization of GaN/p-Si Thin Films for Various Argon Flow Rates

Mantarcı, Asim
  • 期刊名称JOM
  • 作者Mantarcı, Asim
  • 印刷ISSN1047-4838
  • 电子ISSN1543-1851
  • 文件大小1374.68KB
  • 发表时间2019-10-29
  • DOI10.1007/s11837-019-03878-x
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