[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Efficient Error-Tolerant Quantized Neural Network Accelerators
Gambardella, Giulio; Kappauf, Johannes; Blott, Michaela; Doehring, Christoph; Kumm, Martin; Zipf, Peter; Vissers, Kees
- 作者Gambardella, Giulio; Kappauf, Johannes; Blott, Michaela; Doehring, Christoph; Kumm, Martin; Zipf, Peter; Vissers, Kees
- 文件大小258.26KB
- 发表时间2019
- DOI10.1109/DFT.2019.8875314
- 页码1-6