On the use of cosmic muons to assess the local attenuation of terrestrial cosmic neutrons in real-time SEB testing of power devices
Ciappa, Mauro; Pocaterra, Marco
- 期刊名称Microelectronics Reliability
- 作者Ciappa, Mauro; Pocaterra, Marco
- 印刷ISSN0026-2714
- 文件大小1199.55KB
- 发表时间2019-09
- DOI10.1016/j.microrel.2019.113419