Strategy for Diagnosing the Aging of an IGBT Module by ON-State Voltage Separation
Du, Mingxing; Kong, Qingyi; Ouyang, Ziwei; Wei, Kexin; Hurley, William G.
- 期刊名称IEEE Transactions on Electron Devices
- 作者Du, Mingxing; Kong, Qingyi; Ouyang, Ziwei; Wei, Kexin; Hurley, William G.
- 卷第66卷
- 期第11期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小2507.98KB
- 发表时间2019-11
- DOI10.1109/TED.2019.2942767
- 页码4858-4864