[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Bayesian models for early cross-layer reliability analysis and design space exploration
Vallero, Alessandro; Savino, Alessandro; Carelli, Alberto; Carlo, Stefano Di
- 作者Vallero, Alessandro; Savino, Alessandro; Carelli, Alberto; Carlo, Stefano Di
- 文件大小135.26KB
- 发表时间2019
- DOI10.1109/iolts.2019.8854452
- 页码143-146