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[IEEE 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS) - Nashville, TN, USA (2019.11.3-2019.11.6)] 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS) - A Broadband Logarithmic Power Detector Using 130 nm SiGe BiCMOS Technology

[IEEE 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS) - Nashville, TN, USA (2019.11.3-2019.11.6)] 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS) - A Broadband Logarithmic Power Detector Using 130 nm SiGe BiCMOS Technology

Gong, Yunyi; Lee, Seokchul; Ying, Hanbin; Omprakash, Anup P.; Gebara, Edward; Gu, Huifang; Nicholls, Charles; Cressler, John D.
  • 作者Gong, Yunyi; Lee, Seokchul; Ying, Hanbin; Omprakash, Anup P.; Gebara, Edward; Gu, Huifang; Nicholls, Charles; Cressler, John D.
  • 文件大小2300.55KB
  • 发表时间2019
  • DOI10.1109/BCICTS45179.2019.8972724
  • 页码1-4
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