[IEEE 2019 IEEE 4th International Conference on Integrated Circuits and Microsystems (ICICM) - Beijing, China (2019.10.25-2019.10.27)] 2019 IEEE 4th International Conference on Integrated Circuits and Microsystems (ICICM) - Application and Comparison of the Contactless Overvoltage Measurement System Based on Integrated Electro-Optic Sensors
Xu, Ning; Zhao, Lin; Wang, Shaohe; Yang, Yong
- 作者Xu, Ning; Zhao, Lin; Wang, Shaohe; Yang, Yong
- 文件大小7614.68KB
- 发表时间2019
- DOI10.1109/ICICM48536.2019.8977156
- 页码48-52