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[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - 17th IEEE East-West Design and Test Symposium

[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - 17th IEEE East-West Design and Test Symposium

Zorian, Yervant; Hahanov, Vladimir; Chumachenko, Svetlana; Litvinova, Eugenia

作者Zorian, Yervant; Hahanov, Vladimir; Chumachenko, Svetlana; Litvinova, Eugenia
文件大小930.16KB
发表时间2019
DOI10.1109/itc44170.2019.9000168
页码1-4

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