[IEEE IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society - Lisbon, Portugal (2019.10.14-2019.10.17)] IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society - Characterization of Parasitic Elements in Capacitors for Fast-switching Resonant Converters
- 作者Hergt, Martin; Mayer, Lukas W.; Sack, Martin; Honsberg, Martin; Nielebock, Sebastian; Hiller, Marc
- 文件大小400.03KB
- 发表时间2019
- DOI10.1109/iecon.2019.8927014
- 页码4095-4100
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