[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Practical Dynamic Laser Stimulation Technique and Code Modification: A Soft Defect Localization Approach for Microcontroller Self-Test Failures
- 作者Cala, Kevin Joshua S.; Saludares, Junald C.; Basbas, Wendel A.
- 文件大小4451.52KB
- 发表时间2019
- DOI10.1109/ipfa47161.2019.8984852
- 页码1-8
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