[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia

• 作者Lee, Kuen-Jong; Huang, Shi-Yu; Li, Huawei; Inoue, Tomoo; Zorian, Yervant
• 文件大小1276.48KB
• 发表时间2019
• DOI10.1109/itc44170.2019.9000177
• 页码1-4