[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - IEEE European Test Symposium (ETS)
Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan; Reorda, Matteo Sonza; Tahoori, Mehdi; Vatajelu, Elena-Ioana
- 作者Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan; Reorda, Matteo Sonza; Tahoori, Mehdi; Vatajelu, Elena-Ioana
- 文件大小8484.44KB
- 发表时间2019
- DOI10.1109/itc44170.2019.9000148
- 页码1-4