[IEEE 2019 IEEE Fourth Ecuador Technical Chapters Meeting (ETCM) - Guayaquil, Ecuador (2019.11.11-2019.11.15)] 2019 IEEE Fourth Ecuador Technical Chapters Meeting (ETCM) - UFMC and LTE Convergence Test in Optical Access Network
- 作者Tipan, Milton N.; Arguero, T. Berenice; Arevalo, German V.
- 文件大小724.16KB
- 发表时间2019
- DOI10.1109/etcm48019.2019.9014889
- 页码1-4
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