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Fault Detection for a Class of Uncertain Sampled-Data Systems Using Deterministic Learning

Fault Detection for a Class of Uncertain Sampled-Data Systems Using Deterministic Learning

Chen, Tianrui; Wang, Cong; Hill, David J.

期刊名称IEEE Transactions on Cybernetics
作者Chen, Tianrui; Wang, Cong; Hill, David J.
印刷ISSN2168-2267
电子ISSN2168-2275
文件大小1957.32KB
发表时间2020
DOI10.1109/TCYB.2019.2963259
页码1-11

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