Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping

Richard, Marie‐Ingrid; Cornelius, Thomas W.; Lauraux, Florian; Molin, Jean‐Baptiste; Kirchlechner, Christoph; Leake, Steven J.; Carnis, Jérôme; Schülli, Tobias U.; Thilly, Ludovic; Thomas, Olivier

期刊名称Small
作者Richard, Marie‐Ingrid; Cornelius, Thomas W.; Lauraux, Florian; Molin, Jean‐Baptiste; Kirchlechner, Christoph; Leake, Steven J.; Carnis, Jérôme; Schülli, Tobias U.; Thilly, Ludovic; Thomas, Olivier
印刷ISSN1613-6810
电子ISSN1613-6829
文件大小2358.81KB
发表时间2020-01-21
DOI10.1002/smll.201905990

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Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping