A New Complete Condition Monitoring Method for SiC Power MOSFETs
- 期刊名称IEEE Transactions on Industrial Electronics
- 作者Ugur, Enes; Xu, Chi; Yang, Fei; Pu, Shi; Akin, Bilal
- 印刷ISSN0278-0046
- 电子ISSN1557-9948
- 文件大小6446.45KB
- 发表时间2020
- DOI10.1109/TIE.2020.2970668
- 页码1-1
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