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Gate-Controllable Electronic Trap Detection in Dielectrics

Gate-Controllable Electronic Trap Detection in Dielectrics

Mondal, Sandip; Paul, Tathagata; Ghosh, Arindam; Venkataraman, V.

期刊名称IEEE Electron Device Letters
作者Mondal, Sandip; Paul, Tathagata; Ghosh, Arindam; Venkataraman, V.
卷第41卷
期第5期
印刷ISSN0741-3106
电子ISSN1558-0563
文件大小8817.88KB
发表时间2020-5
DOI10.1109/LED.2020.2985292
页码717-720

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