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An Empirical Study of Model-Agnostic Techniques for Defect Prediction Models

An Empirical Study of Model-Agnostic Techniques for Defect Prediction Models

Jiarpakdee, Jirayus; Tantithamthavorn, Chakkrit; Dam, Hoa Khanh; Grundy, John
  • 期刊名称IEEE Transactions on Software Engineering
  • 作者Jiarpakdee, Jirayus; Tantithamthavorn, Chakkrit; Dam, Hoa Khanh; Grundy, John
  • 印刷ISSN0098-5589
  • 电子ISSN1939-3520
  • 文件大小897.53KB
  • 发表时间2020
  • DOI10.1109/tse.2020.2982385
  • 页码1-1
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