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Hot-Hole versus Hot-Electron Transport at Cu/GaN Heterojunction Interfaces

Tagliabue, Giulia; DuChene, Joseph S.; Habib, Adela; Sundararaman, Ravishankar; Atwater, Harry A.

期刊名称ACS Nano
作者Tagliabue, Giulia; DuChene, Joseph S.; Habib, Adela; Sundararaman, Ravishankar; Atwater, Harry A.
印刷ISSN1936-0851
电子ISSN1936-086X
文件大小881.34KB
发表时间2020-04-27
DOI10.1021/acsnano.0c00713