Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction
Berenguer, Felisa; Pettinari, Giorgio; Felici, Marco; Balakrishnan, Nilanthy; Clark, Jesse N.; Ravy, Sylvain; Patané, Amalia; Polimeni, Antonio; Ciatto, Gianluca
- 期刊名称Communications Materials
- 作者Berenguer, Felisa; Pettinari, Giorgio; Felici, Marco; Balakrishnan, Nilanthy; Clark, Jesse N.; Ravy, Sylvain; Patané, Amalia; Polimeni, Antonio; Ciatto, Gianluca
- 卷第1卷
- 期第1期
- 电子ISSN2662-4443
- 文件大小1623.27KB
- 发表时间2020-12
- DOI10.1038/s43246-020-0021-6