海量图书期刊资源,随时随地畅享阅读乐趣
Technological shifts in surface metrologyX. Jane Jiang; David J. Whitehouse · 2012
Advanced Metrology || IntroductionJiang, X. Jane · 2020
Advanced Metrology || Free-form surface samplingJiang, X. Jane · 2020
Advanced Metrology || Free-form surface reconstructionJiang, X. Jane · 2020
Advanced Metrology || Fundaments for free-form surfacesJiang, X. Jane · 2020
Advanced Metrology || Characterization of free-form surfacesJiang, X. Jane · 2020
Heterodyne detection with a weak local oscillatorJiang, Leaf A.; Luu, Jane X. · ao/47/10/ao-47-10-1486.pdf · 2008