最新软弱地基处理技术
- 作者（日本）福冈正巳编
- 出版社冶金部建筑研究总院地基基础技术情报研究室
- 标注页数266 页
- 文件页数275 页
- 文件大小7.94 MB
- 出版时间1983
SPIE Proceedings [SPIE ITCom 2003 - Orlando, FL (Sunday 7 September 2003)] Semiconductor Optoelectronic Devices for Lightwave Communication - Integrated-cavity surface-emitting lasersLiu, Bin; Piprek, Joachim; Okuno, Yae; Piprek, Joachim; Bowers, John E. · 2003
SPIE Proceedings [SPIE ITCom 2003 - Orlando, FL (Sunday 7 September 2003)] Semiconductor Optoelectronic Devices for Lightwave Communication - Wafer-bonded VCSELs with tunnel junctionsMehta, Manish; Piprek, Joachim; Jayaraman, Vijay; Jackson, Andrew; Wu, Shaomin; Okuno, Yae; Piprek, Joachim; Bowers, John E. · 2003
SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Physics and Applications of Optoelectronic Devices - <title>Saturation analysis of a monolithic wavelength converter</title>Piprek, Joachim; Hutchinson, John M.; Henness, Jeffrey A.; Masanovic, Milan L.; Coldren, Larry A.; Piprek, Joachim · 2004
SPIE Proceedings [SPIE ITCom 2003 - Orlando, FL (Sunday 7 September 2003)] Semiconductor Optoelectronic Devices for Lightwave Communication - <title>Nonlinear behavior of traveling-wave electroabsorption modulators</title>Shim, Jongin; Liu, Bin; Chiu, Yi-Jen; Piprek, Joachim; Bowers, John E.; Piprek, Joachim · 2003
SPIE Proceedings [SPIE ITCom 2003 - Orlando, FL (Sunday 7 September 2003)] Semiconductor Optoelectronic Devices for Lightwave Communication - <title>InP-based waveguide photodetector with integrated photon multiplication</title>Pasquariello, Donato; Piprek, Joachim; Lasaosa, Daniel; Bowers, John E.; Piprek, Joachim · 2003
SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Physics and Applications of Optoelectronic Devices - <title>Internal efficiency analysis of 280-nm light emitting diodes</title>Piprek, Joachim; Moe, Craig G.; Keller, Sarah L.; Nakamura, Shuji; DenBaars, Steven P.; Piprek, Joachim · 2004
SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Gallium Nitride Materials and Devices VI - <title>Unified model for the GaN LED efficiency droop</title>Piprek, Joachim; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; Piprek, Joachim; Yoon, Euijoon · 2011
SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Gallium Nitride Materials and Devices V - GaN-based VCSELs: analysis of internal device physics and performance limitationsChyi, Jen-Inn; Piprek, Joachim; Li, Simon; Nanishi, Yasushi; Morkoç, Hadis; Litton, Cole W.; Piprek, Joachim; Yoon, Euijoon · 2010