Theorien der Elektrizität Elektrostatik || Dielektrika
- 作者Güntherschulze, A.; Kottler, F.; Thirring, H.; Zerner, F.; Westphal, W.
- 文件大小12147.09KB
- 发表时间1927
- DOI10.1007/978-3-642-99428-9_5
- 页码493-560
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Calculation of Debye-Waller Temperature Factors for GaAsCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Hydrogenated Nanocrystalline Silicon Investigated by Conductive Atomic Force MicroscopyCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || EBIC Characterization of Light Emitting Structures Containing InGaN/GaN MQWCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Three-Dimensional Field Models for Reverse Biased P-N JunctionsCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Moore's Law and its Effect on Microscopy in the Semiconductor IndustryCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || STEMSIM—a New Software Tool for Simulation of STEM HAADF Z-Contrast ImagingCullis, A. G.; Midgley, P. A. · 2008
[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Electron Microscopy Analysis of AlGaN/GaN Nanowires Grown by Catalyst-Assisted Molecular Beam EpitaxyCullis, A. G.; Midgley, P. A. · 2008