海量图书期刊资源,随时随地畅享阅读乐趣
Incremental stress effects in transistorsR.H. Mattson; L.D. Yau; J.R. DuBois · 1967
Arguments for electron conduction in silicon nitrideYau, L.D. · IEEE Electron Device Letters · 1984
On the ‘excess white noise’ in MOS transistorsL.D. Yau; C.T. Sah · 1969
Scaling of surface-channel charge-coupled devicesYau, L.D. · 1976
Quenched-in centers in silicon p+n junctionsL.D. Yau; C.T. Sah · 1974
Applications of the electron beam exposure systemPease, R.F.W.; Ballantyne, J.P.; Henderson, R.C.; Voshchenkov, A.M.; Yau, L.D. · 1975