![SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Laser Interferometry X: Techniques and Analysis - <title>Surface strain characterization using time-division-multiplexed 3D shearography</title>]()
SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Laser Interferometry X: Techniques and Analysis - <title>Surface strain characterization using time-division-multiplexed 3D shearography</title>James, Stephen W.; Groves, Roger M.; Tatam, Ralph P.; Kujawinska, Malgorzata; Pryputniewicz, Ryszard J.; Takeda, Mitsuo · 2000