![Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping]()
Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt MappingRichard, Marie‐Ingrid; Cornelius, Thomas W.; Lauraux, Florian; Molin, Jean‐Baptiste; Kirchlechner, Christoph; Leake, Steven J.; Carnis, Jérôme; Schülli, Tobias U.; Thilly, Ludovic; Thomas, Olivier · Small · 2020