![[IEEE Comput. Soc. Press 10th International Conference on Pattern Recognition - Atlantic City, NJ, USA (16-21 June 1990)] [1990] Proceedings. 10th International Conference on Pattern Recognition - Curvature consistency improves local shading analysis]()
[IEEE Comput. Soc. Press 10th International Conference on Pattern Recognition - Atlantic City, NJ, USA (16-21 June 1990)] [1990] Proceedings. 10th International Conference on Pattern Recognition - Curvature consistency improves local shading analysisFerrie, F.P.; Lagarde, J. · 1990