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[IEEE Comput. Soc. Press 10th International Conference on Pattern Recognition - Atlantic City, NJ, USA (16-21 June 1990)] [1990] Proceedings. 10th International Conference on Pattern Recognition - Curvature consistency improves local shading analysis

[IEEE Comput. Soc. Press 10th International Conference on Pattern Recognition - Atlantic City, NJ, USA (16-21 June 1990)] [1990] Proceedings. 10th International Conference on Pattern Recognition - Curvature consistency improves local shading analysis

Ferrie, F.P.; Lagarde, J.

作者Ferrie, F.P.; Lagarde, J.
文件大小767.09KB
发表时间1990
DOI10.1109/ICPR.1990.118067
页码70-76

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