![[IEEE 19th International Reliability Physics Symposium - Las Vegas, NV, USA (1981.04.7-1981.04.9)] 19th International Reliability Physics Symposium - Condensation Thermography - A Novel Approach for Locating Short Circuits and Determing Surface Temperatures in Semiconductor Die]()
[IEEE 19th International Reliability Physics Symposium - Las Vegas, NV, USA (1981.04.7-1981.04.9)] 19th International Reliability Physics Symposium - Condensation Thermography - A Novel Approach for Locating Short Circuits and Determing Surface Temperatures in Semiconductor DieDerMarderosian, Aaron; Gionet, Vincent; Caccamesi, Vincent · 1981