Éléments de Méchanique Quantiqueby Ph. Pluvinage
- 期刊名称The Mathematical Gazette
- 作者Review by: H. S. W. Massey
- 卷第42卷
- 期第339期
- 印刷ISSN0025-5572
- 文件大小196.52KB
- 发表时间1958-02
- DOI10.2307/3608396
- 页码73-74
[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscopy for Two-Dimensional MaterialsHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy ||Hlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || IonoluminescenceHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Channeling and Backscatter ImagingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscope Fabrication of Solid-State Nanopore Devices for Biomolecule AnalysisHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm ScaleHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Monte Carlo Simulations of Focused Ion Beam Induced ProcessingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Introduction to Imaging Techniques in the HIMHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy ||Hlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || IonoluminescenceHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Channeling and Backscatter ImagingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Introduction to Imaging Techniques in the HIMHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscopy for Two-Dimensional MaterialsHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Direct–Write Milling and Deposition with Noble GasesHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Monte Carlo Simulations of Focused Ion Beam Induced ProcessingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Structural Changes in 2D Materials Due to Scattering of Light IonsHlawacek, Gregor; Gölzhäuser, Armin · 2016