![SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - <title>High-precision laser interferometer for length metrology</title>]()
SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - <title>High-precision laser interferometer for length metrology</title>Pi, Jiajing; Zhao, Li-Zhuan; Du, Jian-Guo; Shen, Wei-Guo; Zhu, Li · 1993