SPC and Continuous Improvementby Mal OwenReview by: William H. Woodall · Technometrics · 1992

Statistical Methods for Testing, Development, and Manufacturingby Forrest W. Breyfogle,Review by: William H. Woodall · The American Statistician · 1993

Statistics for Business: Data Analysis and Modelingby J. D. Cryer; R. B. MillerReview by: Michael D. Conerly and William H. Woodall · The American Statistician · 1994

Response Surface Methodology: 1966-1988Raymond H. Myers, André I. Khuri and Walter H. Carter, Jr. · Technometrics · 1989

Self Modeling Curve ResolutionWilliam H. Lawton and Edward A. Sylvestre · Technometrics · 1971

Estimation from Accelerated Life TestsRichard E. Barlow and Ernest M. Scheuer · Technometrics · 1971

Model Robust, Linear-Optimal DesignsR. Dennis Cook and Christopher J. Nachtsheim · Technometrics · 1982

Developments in Linear Regression Methodology: 1959-1982R. R. Hocking · Technometrics · 1983

Symmetrical and Asymmetrical Fractional Factorial PlansSidney Addelman · Technometrics · 1962

Irregular Fractions of the 2nFactorial ExperimentsSidney Addelman · Technometrics · 1961

Computer Aided Design of ExperimentsR. W. Kennard and L. A. Stone · Technometrics · 1969