![[IEEE 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Taipei, Taiwan (02-04 Aug. 2006)] 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Dynamic Data Stability in SRAM Cells and Its Implications on Data Stability Tests]()
[IEEE 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Taipei, Taiwan (02-04 Aug. 2006)] 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Dynamic Data Stability in SRAM Cells and Its Implications on Data Stability TestsSharifkhani, M.; Jahinuzzaman, S.M.; Sachdev, M. · 2006