![SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - <title>Time-resolved fluorescence analysis</title>]()
SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - <title>Time-resolved fluorescence analysis</title>Ross, J. B. Alexander; Laws, William R.; Bomse, David S.; Brittain, Harry; Farquharson, Stuart; Lerner, Jeremy M.; Rein, Alan J.; Sohl, Cary; Todd, Terry R.; Weyer, Lois · 1992