Power System Reliability Evaluation
- 作者Billinton, Roy; Bonaert, A.; Koivo, A.
- 期第4期
- 印刷ISSN0018-9472
- 文件大小669.55KB
- 发表时间1971
- DOI10.1109/tsmc.1971.4308332
- 页码406-407
[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting -Luisier, Mathieu; Lundstrom, Mark; Antoniadis, Dimitri A.; Bokor, Jeffrey · 2011
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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - IEDM executive committee2011
[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting -Vullers, R.J.M.; van Schaijk, R.; Goedbloed, M.; Elfrink, R.; Wang, Z.; Van Hoof, C. · 2011
[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting -Han, Shu-Jen; Valdes-Garcia, Alberto; Bol, Ageeth A.; Franklin, Aaron D.; Farmer, Damon; Kratschmer, Ernst; Jenkins, Keith A.; Haensch, Wilfried · 2011
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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting -Elfrink, R.; Matova, S.; de Nooijer, C.; Jambunathan, M.; Goedbloed, M.; van de Molengraft, J.; Pop, V.; Vullers, R.J.M.; Renaud, M.; van Schaijk, R. · 2011