[IEEE 2016 15th Biennial Baltic Electronics Conference (BEC) - Tallinn, Estonia (2016.10.3-2016.10.5)] 2016 15th Biennial Baltic Electronics Conference (BEC) - A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund · 2016