High energy electron impact ionization for elemental analysis by energy dispersive X-ray spectrometry
- 作者R. Collé; I. L. Preiss; Angela Li-Scholz; W. Scholz
- 卷第14卷
- 期第1期
- 印刷ISSN0236-5731
- 电子ISSN1588-2780
- 文件大小876.55KB
- 发表时间1973-03
- DOI10.1007/bf02514152
- 页码87-103
Vascular pathology of the spleen, part IIA. M. De Schepper; F. Vanhoenacker; B. Op de Beeck; J. Gielen; P. Parizel · 2005
A compilation of second order reaction interferencesJ. P. Op de Beeck · 1970
A compilation of second order reaction interferencesJ. P. Op de Beeck · 1969
Interference by second order reactions in activation analysisW. Maenhaut; J. P. Op de Beeck · 1970
Low thyroxinaemia occurs in the majority of very preterm newbornsR. P. Rooman; M. V. L. Du Caju; L. Op De Beeck; M. Docx; P. Van Reempts; K. J. Van Acker · 1996
Comparison of flux density distributions from massive or ring-shaped isotopic neutron sourcesL. Alaerts; J. P. Op De Beeck; J. Hoste · 1975
Miniature conductive polymer actuators for high pressure generation in lab on chip systemsM. Hiraoka; P. Fiorini; J. O’Callaghan; I. Yamashita; C. Van Hoof; M. Op de Beeck · 2012
CD control using SiON BARL processing for sub-0.25 μm lithographyF. Zhang; M. Op de Beeck; M. Schaekers; K. Ronse; W. Conley; P. Gopalan; H. Gangala; M. Dusa; J. Bendik · 1999