Modulation spectroscopy in superlatticesFred H. Pollak; H. Shen · 1989

-InSb under uniaxial stressRanvaud, R.; Trebin, H. -R.; Rössler, U.; Pollak, Fred H. · Physical Review B · 1979

Photoreflectance characterization of semiconductors and semiconductor heterostructuresFred H. Pollak; H. Shen · 1990

SPIE Proceedings [SPIE 1983 Cambridge Symposium - Cambridge (Monday 7 November 1983)] Spectroscopic Characterization Techniques for Semiconductor Technology I - <title>Raman Characterization Of Semiconductors Revisited</title>Pollak, Fred H.; Tsu, Raphael; Bauer, Robert S.; Pollak, Fred H. · 1984

Modulation spectroscopy characterization of MOCVD semiconductors and semiconductors structuresFred H. Pollak; H. Shen · 1989

Raman investigation of rutile RuO2Y.S. Huang; Fred H. Pollak · 1982

Electroreflectance study of RuSe2Y.S. Huang; S.S. Lin; J.S. Sheu; W.M. Shen; Fred H. Pollak · 1990

Modulation spectroscopy of semiconductor microstructuresFred H. Pollak · 1991