Photoreflectance characterization of semiconductors and semiconductor heterostructures
- 作者Fred H. Pollak; H. Shen
- 卷第19卷
- 期第5期
- 印刷ISSN0361-5235
- 电子ISSN1543-186X
- 文件大小852.63KB
- 发表时间1990-05
- DOI10.1007/bf02657997
- 页码399-406
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