Evaluation of Deep Levels in Semiconductors Using Field Effect Transconductance
- 期刊名称Japanese Journal of Applied Physics
- 作者Wada, Osamu; Yanagisawa, Shintaro; Takanashi, Hirobumi
- 卷第14卷
- 期第1期
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小258.00KB
- 发表时间1975-1
- DOI10.1143/JJAP.14.157
- 页码157-158
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