SPIE Proceedings [SPIE 1982 Los Angeles Technical Symposium - Los Angeles (Wednesday 27 January 1982)] Laser and Laser Systems Reliability - Proton Damage In Laser Diodes And Light-Emitting Diodes (LEDs)
- 作者Arimura, I.; Barnes, C. E.; Evans, Gary A.
- 卷第328卷
- 印刷ISSN0277-786X
- 文件大小207.81KB
- 发表时间1982
- DOI10.1117/12.933889
- 页码83-87
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